Research Instruments & Capabilities
Advanced instrumentation supporting materials science research in polymer chemistry, nanotechnology, and surface science. Our laboratory combines state-of-the-art thermal analysis, microscopy, processing, and characterization tools to enable cutting-edge materials research and collaborative projects.
Our capabilities support fundamental research as well as collaborative projects with industry partners through the Industrial Affiliates Program, spanning thermal property measurement, materials characterization, process development, and analytical testing.
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Testing & Measurement Capabilities
Our integrated instrumentation suite enables comprehensive materials characterization from molecular to macroscopic scales, supporting research from fundamental studies to applied materials development.
Thermal Analysis & Environmental Testing
C-Therm TRIDENT Thermal Conductivity Analyzer
MTPS Method • Modified Transient Plane Source • ASTM D7984
Thermal Conductivity Range: 0.03 – 500 W·m⁻¹·K⁻¹
Temperature Range: -50°C to +200°C
Test Time: 1-3 seconds
Precision: ±1-3% (±5% accuracy)
Sample Types: Solids, liquids, powders, pastes
Method: Single-sided MTPS sensor
Fast and accurate thermal property measurement for materials development and QC testing. Single-sided sensor enables testing of samples under various environmental conditions.
Tenney Junior Environmental Test Chamber
Model TJR • Programmable Temperature Control • 40×28×30 cm Workspace
Temperature Range: -75°C to +200°C
Stability: ±0.3°C
Controller: 24-step Watlow 942
Cooling: Cascade refrigeration system
Heating: Open-wire nichrome elements
Features: Side port for running wires
Precise environmental conditioning for thermal cycling, component testing, and materials characterization under controlled temperature conditions with convenient wire access.
Tube Furnace
High-Temperature Processing • Up to 1200°C • Controlled Atmosphere Capability
Temperature Range: Ambient to 1200°C
Atmosphere: Controlled inert gas capability
Heating Zone: Uniform temperature profile
Applications: Materials synthesis, annealing
Processes: Calcination, heat treatment
Sample Types: Powders, ceramics, composites
Essential for high-temperature processing of materials, polymer degradation studies, and synthesis of inorganic compounds under controlled atmosphere conditions.
Precision Analysis & Monitoring
Mettler Toledo AB265-S Analytical Balance
High-Precision Microbalance • RS232 Interface • Custom Software Integration
Readability: 0.01 mg precision
Capacity: 210 grams
Data Interface: RS232 serial communication
Monitoring: Continuous mass tracking
Software: Custom data acquisition
Applications: Real-time process monitoring
Ultra-precise mass measurement with automated data logging for kinetic studies, reaction monitoring, and quality control applications requiring continuous mass tracking.
Microscopy & Imaging
Leica M125 C Stereo Microscope
Model M125 C • 10x Zoom • Digital Camera System
Zoom Range: 10x continuous zoom
Magnification: Variable with eyepieces
Working Distance: Large working distance
Illumination: LED ring lighting
Imaging: Digital camera for photography
Applications: 3D inspection, documentation
High-resolution stereo microscopy with integrated camera system for detailed inspection and documentation of materials, composites, and surface features.
Materials Processing & Synthesis
Silverson L5M-A High-Shear Laboratory Mixer
1 HP Variable Speed Motor • Multiple Rotor-Stator Heads
Speed Range: 0-10,000 rpm
Batch Volume: 1 mL to 12 L
Inline Flow: Up to 20 L/min
Motor Power: 746 W (1 HP)
Viscosity Range: Up to ~10,000 cP
Wetted Parts: 316L stainless steel
High-shear mixing for emulsification, homogenization, particle size reduction, and dispersion of polymers, nanoparticles, and composite materials.
Tip Sonicator
Ultrasonic Processor • Variable Amplitude
Type: Ultrasonic processor
Applications: Nanoparticle dispersion
Control: Variable intensity
High-intensity ultrasonic processing for precise dispersion and homogenization.
Bath Sonicator
Ultrasonic Cleaning • Temperature Control
Applications: Cleaning, degassing
Volume: Large bath capacity
Control: Heated ultrasonic bath
Gentle ultrasonic processing for cleaning and mild dispersion applications.
Innovative Technology Glove Box
Model SYS1-2GB-PLC • Inert Atmosphere Workstation • Built-in Freezer • O₂ & H₂O Control
Atmosphere: Nitrogen or argon purged
O₂ Level: < 1 ppm achievable
H₂O Level: < 1 ppm achievable
Access: Multiple glove ports
Transfer: Dual antechambers (large & small)
Freezer: Built-in freezer compartment
Applications: Air-sensitive materials
Controlled environment for handling extremely air-sensitive materials with ultra-low oxygen and moisture levels. Built-in freezer compartment enables low-temperature storage and processing of sensitive compounds under inert atmosphere.
VWR Vacuum Oven
Vacuum Drying & Heat Treatment • Precise Control
Range: Ambient to 250°C
Vacuum: Down to -30 inHg
Applications: Vacuum drying, degassing
Safety: Over-temperature protection
Vacuum oven for removing moisture and solvents under reduced pressure, preventing oxidation and enabling low-temperature drying.
HPLC Pumps
Continuous Flow • High Precision
Applications: Flow reactions
Precision: High-accuracy delivery
Uses: Microfluidics, process optimization
High-precision liquid delivery for continuous flow experiments.
Vacuum Line
Schlenk Line System • Dual Manifold • Inert Atmosphere Handling
Vacuum Level: High vacuum capability
Gas Lines: Vacuum manifold, nitrogen option
Connections: Multiple ports available
Applications: Air-sensitive synthesis
Techniques: Schlenk flask operations
Safety: Inert atmosphere protection
Essential for air-sensitive chemistry, enabling synthesis and manipulation of materials under controlled atmosphere conditions with vacuum and inert gas capabilities.
Particle & Surface Analysis
Dispersion Technology DT-1202 Acoustic & Electroacoustic Spectrometer
Combined Acoustic & CVI Methods • ISO 20998-1, ISO 13099-1 • No Dilution Required
Particle Size Range: 0.02-100 μm
Frequency Range: 1-100 MHz
Concentration: 0.1-60 vol%
Zeta Potential: ±0.1 mV precision
Sample Volume: 15-120 mL
pH Range: 0.5-13.5 (±0.1)
Simultaneous particle size distribution and zeta potential measurement in concentrated dispersions, emulsions, and suspensions without dilution. Optional rheology and titration capabilities.
Microtrac Partan 3D Particle Analyzer
Dynamic Image Analysis • 3D Particle Characterization • 40+ Morphological Parameters
Size Range: 0.28 μm to 127 mm
Analysis Speed: 100 images per second
3D Analysis: Length × Width × Thickness
Parameters: Size, shape, surface roughness
Sample Types: Dry and wet particles
Imaging: High-resolution dual camera system
Advanced particle characterization providing comprehensive morphological analysis including true 3D dimensions, shape parameters, and surface properties.
Separation & Centrifugation
Beckman Coulter Avanti J-20 XP Centrifuge
High-Speed Refrigerated Floor Centrifuge • Friction Reduction System
Speed Range: 100-26,000 RPM
Temperature Control: -10°C to +40°C
Max RCF: 82,000 × g
Capacity: Up to 6 liters
Timer Range: 1-180 minutes or continuous
Accuracy: ±10 RPM or ±0.1%
High-performance centrifuge for sample separation, pelleting, and purification with precise temperature and speed control for sensitive biological and materials samples.
Electrical Characterization
Keithley SourceMeter Systems
Models 2400 & 2420 • Four-Quadrant Source & Measure • 5½-Digit Resolution
Model 2400: 200V max, 1A max
Model 2420: 60V max, 3A max
Accuracy: 0.012% basic accuracy
Speed: 520 readings/second (GPIB)
Sweep Points: Up to 2500 points
Measurement: V, I, R concurrent
Precision I-V characterization for semiconductors, sensors, batteries, and electronic materials with automated testing and data acquisition capabilities.
Signatone S-302 4 Point Probe
Resistivity Measurement System • Sheet Resistance & Bulk Resistivity
Measurement Range: 1 mΩ to 800 kΩ per square
Sample Size: Up to 4″ or 6″ wafers
Probe Spacing: 40 mil (1.016 mm)
Accuracy: Better than 1% with standards
Sample Types: Wafers, thin films, substrates
Method: ASTM F84-99 dual configuration
Precise measurement of electrical resistivity and sheet resistance for semiconductor materials, conductive films, and electronic substrates.
Additional Instrumentation Access
IMS Core Facilities
Access to University of Connecticut Institute of Materials Science core laboratories including: AFM, XRF, FTIR, NMR, GPC, XRD, SEM, TEM, mechanical testing, and specialized surface analysis capabilities. View complete instrumentation list →
Research & Collaborative Capabilities
Materials Characterization
Comprehensive thermal, electrical, and morphological analysis capabilities for advanced materials research, product development, and performance validation studies.
Process Development
Advanced mixing, dispersion, and synthesis capabilities with real-time monitoring for process optimization and scale-up studies in materials processing.
Collaborative Research
Partnership opportunities through the Industrial Affiliates Program for materials testing and characterization projects requiring specialized analytical capabilities.
Interested in Collaboration?
For inquiries about materials testing, characterization projects, or research partnerships, please visit our Contact Us page.